Collection of powder X-ray diffraction data for a wide variety of powdered samples
- Samples for which data can be collected include air sensitive materials.
- Analysis includes peak identification, and phase identification using the PDF data base.
- Rigaku Ultima IV Powder X-ray diffraction system (Cu Kα radiation) with a diffracted
beam graphite monochromator. The instrument has a thin film attachment and can also
be configured for SAXS measurements.
- Bruker D2 Phaser with LYNXEYE silicon strip detector. This instrument is used for the collection of routine powder X-ray diffraction patterns.
For best results we use about 0.2 g of powdered material. Smaller quantities can be run. It is possible to collect data on quantities as small as 10 mg using a zero background holder, albeit with reduced signal intensity.
To submit a sample please complete the Powder X-ray Diffraction Sample Submission Form [pdf] and deliver samples to John M. Palms Center for Graduate Student Research Room 503.