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College of Engineering and Computing


Aberration-Corrected Scanning Transmission Electron Microscopy Facility

The facility's JEOL JEM2100F aberration-corrected scanning transmission electron microscope (STEM) characterizes the structure and composition of materials at atomic resolution.

JEM2100F 200kV FEG-STEM/TEM

  • Schottky field emission gun (FEG) with 1eV FWHM energy resolution
  • CEOS hexapole Cs corrector for the electron probe
  • 0.1nm resolution in HAADF mode
  • Fischione high angle annular darkfield detector (HAADF)
  • JEOL STEM bright field detector (BF)
  • Annular bright field (ABF) capability with the Fischione annular detector
  • Oxford Inca solid-state EDS detector
  • Gatan Tridiem Imaging Filter for energy filtered imaging and electron energy loss spectroscopy (EELS)
  • EELS and EDS spectrum imaging with Gatan Microscopy Suite
  • JEOL low background (Be) double-tilt holder for EDS
  • Protochips Aduro MEMs heating holder

TEM Performance

  • 0.19nm point resolution, 0.1nm information limit
  • Gatan Erlangshen wide angle CCD camera
  • Gatan 4K Ultrascan camera as part of the Tridiem GIF

 

Contact Us

For more information, email Douglas A. Blom at blomd@mailbox.sc.edu or call 803-777-2886.

Address

Coker Life Sciences 001
715 Sumter St.
Columbia, SC 29208